Insturement that provides 3-D images of the surface of a sample by using a focused beam of electrons.



Solid samples can be observed with high magnifications. SEM goes up to 300 000x magnifications, but practical values vary between 20-100 000x magnification.

Device has following detectors:

- EDS (Energy dispersive spcetroscopy)

• Gives elemental information from the sample. Detects elements based on the x-rays. Light elements are not reliably determined with this. Can be considered to be more qualitative analysis more than quantative analysis.